001 diameter – on a perfect as-manufactured at MMC size datum located part. So, the datum reference frame origin could shift a maximum of. 001 RFS while the datum reference plane is allowed to shift within the boundaries set by any divergence from datum B MMC size – collectively.
DATUM ENGINEERING SIMULATOR
001) projecting perpendicular from datum A surface and at the basic dimension location and orientation from one another - manufactured at gage tolerance accuracy.įrom that datum simulator each of the ten holes are verified to a position tolerance of. So, the datum simulator could be a flat plate with six pins at the datum B MMC size (dia. Yes, I didn't see the MMC modifier that is applied to datum B within the feature control frame for the ten holes. A CMM might be programmed to measure the top and bottoms of each hole feature and thur mathematically derived that datum location from the actual sizes of the each hole. This means that our datum simulators are at the maximum size for the hole features and movement is not possible. I think your question is related to the secondary pattern datum thus no, there would not be relative displacement from that datum pattern features as it is specified at regardless of feature size. Horizontal and vertical to the drawing view given.ģ. The orientation of the datum created by the pattern is perpendicular to the primary datum and as noted above consistent with the feature pattern datum. What does matter is that the location and orientation of the secondary and tertiary datum is established and that the basic dimensions are tolerance-less. Note that that the relative location of the datum created by the pattern is not going to change the measurement relative to the datum pattern. The datum created would be an axis and the related two datum planes (secondary and tertiary) and though there is some debate on the location I am of the view that the location would be at the medium location of all the features in the pattern.
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